The Electron Backscatter Diffraction (EBSD) detector is perhaps the most critical component in any EBSD system. When the Symmetry EBSD detector was launched in 2017, it became the first commercially available EBSD detector to use a complementary metal-oxide semiconductor (CMOS) sensor, providing an unparalleled combination of exceptional analysis speed and diffraction pattern resolution. In 2018, Oxford Instruments subsequently launched 2 additional EBSD detectors to complete its CMOS detector range, the C-Nano and the C-Swift. All 3 detectors benefit from market-leading sensitivity, delivered by their unique fibre-optic lens system and customised CMOS sensors. You can read more about the importance of fibre optics and sensitivity here.
The latest release of the Symmetry S3 detector further increases the maximum analysis speed to > 5700 indexed patterns per second (pps), enabling routine characterisation of materials in just a matter of seconds, with significant improvements also made to the C-series detectors with the recent launch of the C-Nano+ and C-Swift+. Read about the key aspects of each detector, below, or refer to the main Oxford Instruments NanoAnalysis product webpages.
The Symmetry S3 is the only genuine all-in-one EBSD detector on the market, and is based on the revolutionary Symmetry detector, the world’s first EBSD detector to utilise advanced CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and a range of innovative design features. Highlights include:
Find out more on the Symmetry S3 product page.
See for yourself the versatility and performance of the previous generation Symmetry S2 detector in this promotional video.
The C-Nano+ is a versatile and effective EBSD detector. The innovative technology that has helped the Symmetry detector make such an impact has been implemented in the C-Nano+, delivering class-leading performance at an entry level. The C-Nano+ is suited to characterising all types of samples, but its high pixel resolution makes it ideal for detailed strain analyses as well as for routine work on complex and challenging materials. Highlights include:
Find out more on the C-Nano+ product page.
The C-Swift+ is the newest member of our CMOS detector family designed for routine materials analysis and high throughput sample characterisation.
The C-Swift+ benefits from many of the features that have made Symmetry such a groundbreaking EBSD detector including, of course, a customised CMOS sensor designed for EBSD. Highlights include:
Find out more on the C-Swift+ product page.